inproceedings - Noise Analysis to Guide Denoising of Scanning Electron Microscopy Images 9th IEEE International Conference on Control, Decision and Information Technologies (CoDIT 2023) / Roma, Italy (2023, Pages pages 6) Rahman, Sheikh Shah Mohammad Motiur | Salomon, Michel | Dembele, Sounkalo
inproceedings - Machine Learning Aided Classification of Noise Distribution in Scanning Electron Microscopy Images 3rd IEEE International Conference on Computer, Control and Robotics (ICCCR 2023) / Shanghai, China (2023, Pages pages 5) Rahman, Sheikh Shah Mohammad Motiur | Salomon, Michel | Dembele, Sounkalo
inproceedings - A low-cost temperature control system for learning real-time programming 2022 Malian Society of applied sciences (MSAS 2022) / Ségou, Mali (2022, Pages pages 1 - 6) Dembele, Sounkalo | Hirtz, Patricia | Muller, Tristan
inproceedings - Development of a 3D Method Using SEM and Liquid-Phase STEM to Study Cell Morphology 2021 International Conference on In-Situ an Correlative Electron Microscopy (CISCEM 2021) / Paris, France (2021) Bekel, Akkiz | Lebas, Louis-Marie | Lucian, Roiban | Langlois, Cyril | Beb Caal, Mayra Yucely | Dembele, Sounkalo | Piat, Nadine | Gaillard, Claire | Lesaint, Bérangère | Masenelli-Varlot, Karine
inproceedings - Vers le dévracage 3D flexible et low-cost par robot bi-bras: les expériences des S.mart Toulouse et Besançon 16ème Colloque National S-Mart ( 2019) / Les Karellis, France (2019, Pages pages 1 - 6) Taix, Michel | Cadenat, Viviane | Dembele, Sounkalo | Perrard, Christophe
inproceedings - Accurate 3D-Positioning in a SEM through Robot Calibration International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS 2018) / Nagoya, Japan (2018, Pages pages 1 - 6) Guelpa, Valerian | Kudryavtsev, Andrey | Piat, Nadine | Dembele, Sounkalo
inproceedings - Full 3D Rotation Estimation in Scanning Electron Microscope International Conference on Intelligent Robots and Systems (2017) / Vancouveur, Canada (2017, Pages pages 1134 - 1139) Kudryavtsev, Andrey | Dembele, Sounkalo | Piat, Nadine
inproceedings - Stereo-image Rectification for Dense 3D Reconstruction in Scanning Electron Microscope International Conference on Manipulation, Automation and Robotics at Small Scales (2017) / Montréal, Canada (2017, Pages pages 1 - 6) Kudryavtsev, Andrey | Dembele, Sounkalo | Piat, Nadine
article - Combining Gradient Ascent Search and Support Vector Machines for Effective Autofocus of a Field Emission – Scanning Electron Microscope. Journal of Microscopy (Volume 264, Issue (1), oct 2016, Pages :79 - 87) Dembele, Sounkalo | Lehmann, Olivier | Medjaher, Kamal | Marturi, Naresh | Piat, Nadine
inproceedings - Mesure de profondeur dans un microscope électronique à balayage par autofocus. 14ème Colloque National AIP-PRIMECA / La Plagne, France (2015, Pages pages 372-377) Dembele, Sounkalo | Piat, Nadine
inproceedings - Visual Servoing Schemes for Automatic Nanopositioning Under Scanning Electron Microscope. IEEE International Conference on Robotics and Automation, ICRA'14. / Hong Kong, China (2014, Pages pages 981-986) Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
inproceedings - Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation International Conference on Control, Automation, Robotics & Embedded Systems, CARE'13. / Jabalpur, India, India (2013, Pages pages 6) Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
inproceedings - Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration IEEE International Conference on Automation Science and Engineering, CASE'13. / Madison, WI, United States (2013, Pages pages 807 - 812) Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
article - Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification. International Journal of Optomechatronics (Volume 6, Mar 2012, Pages :1-16) Malti, Abed Chaib | Dembele, Sounkalo | Piat, Nadine | Arnoult, Claire | Marturi, Naresh