Current research

  • Scanning Electron Microscope -based Computer Vision

    • Image Signal-Noise Ratio (SNR) analysis

    • Image drift analysis

    • Calibration and autocalibration

    • Autofocus

    • Acoustic field mapping

    • Motion metrology from Fourier transform and Pattern matching

    • Dimension metrology for 3D point cloud

    • Shape from focus, Shape from motion

    • Positioning, Characterization, Manipulation

  • Photon Microscope -based Computer Vision

    • Virtual microscopy using mosaicing and trifocal transfer

    • Shape from focus

    • Motion metrology from CAD model

    • Manipulation, Assembly