article - Combining Gradient Ascent Search and Support Vector Machines for Effective Autofocus of a Field Emission – Scanning Electron Microscope. Journal of Microscopy (Volume 264, Issue (1), oct 2016, Pages :79 - 87) Dembele, Sounkalo | Lehmann, Olivier | Medjaher, Kamal | Marturi, Naresh | Piat, Nadine
inproceedings - Visual Servoing Schemes for Automatic Nanopositioning Under Scanning Electron Microscope. IEEE International Conference on Robotics and Automation, ICRA'14. / Hong Kong, China (2014, Pages pages 981-986) Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
inproceedings - Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation International Conference on Control, Automation, Robotics & Embedded Systems, CARE'13. / Jabalpur, India, India (2013, Pages pages 6) Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
inproceedings - Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration IEEE International Conference on Automation Science and Engineering, CASE'13. / Madison, WI, United States (2013, Pages pages 807 - 812) Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
article - Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification. International Journal of Optomechatronics (Volume 6, Mar 2012, Pages :1-16) Malti, Abed Chaib | Dembele, Sounkalo | Piat, Nadine | Arnoult, Claire | Marturi, Naresh