Publications

View all publications (12)2016 (3)2015 (1)2014 (2)2013 (3)2012 (3)

2016 (3)

article - Combining Gradient Ascent Search and Support Vector Machines for Effective Autofocus of a Field Emission – Scanning Electron Microscope.
Journal of Microscopy (Volume 264, Issue (1), oct 2016, Pages :79 - 87)
Dembele, Sounkalo | Lehmann, Olivier | Medjaher, Kamal | Marturi, Naresh | Piat, Nadine
pdf | doi
article - Image-Guided Nanopositioning Scheme for SEM.
IEEE Transactions on Automation Science and Engineering (Volume 99, jun 2016, Pages :1-12)
Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
pdf | doi
article - Visual Servoing-Based Depth Estimation Technique for Manipulation inside SEM
IEEE Transactions on Instrumentation and Measurement (Volume 65, Issue (8), 2016, Pages :1847 - 1855)
Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
pdf | doi

2015 (1)

inproceedings - Closed-Loop Autofocus Scheme for Scanning Electron Microscope.
International Symposium on Optomechatronic Technology (ISOT 2015) / Neuchâtel, France (2015, Pages pages 1-6)
Cui, Le | Marturi, Naresh | Marchand, Eric | Dembele, Sounkalo | Piat, Nadine
doi | bibtex@inproceedings{0f6b7ef1-42d8-4dc9-bacf-22736eb90fc7, title = {Closed-Loop Autofocus Scheme for Scanning Electron Microscope.}, author = {Cui, Le and Marturi, Naresh and Marchand, Eric and Dembele, Sounkalo and Piat, Nadine}, year = {2015}, address = {Neuch\^atel, France}, booktitle = {International Symposium on Optomechatronic Technology (ISOT 2015)}, month = {oct}, pages = {1-6}, doi = {10.1051/matecconf/20153205003} }

2014 (2)

inproceedings - Visual Servoing Schemes for Automatic Nanopositioning Under Scanning Electron Microscope.
IEEE International Conference on Robotics and Automation, ICRA'14. / Hong Kong, China (2014, Pages pages 981-986)
Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
pdf | doi | bibtex@inproceedings{245dec07-1d04-47a2-92bb-d74a6099cca9, title = {Visual Servoing Schemes for Automatic Nanopositioning Under Scanning Electron Microscope.}, author = {Marturi, Naresh and Tamadazte, Brahim and Demb\'el\'e, Sounkalo and Piat, Nadine}, year = {2014}, address = {Hong Kong, China}, booktitle = {IEEE International Conference on Robotics and Automation, ICRA'14.}, month = {may}, pages = {981-986}, url = {https://publiweb.femto-st.fr/tntnet/entries/7410/documents/author/data}, doi = {10.1109/ICRA.2014.6906973 }, organization = {IEEE}, publisher = {IEEE} }
article - Scanning electron microscope image signal-to-noise ratio monitoring for micro-nanomanipulation
Scanning (Volume 36, feb 2014, Pages :419 - 429)
Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
pdf | doi

2013 (3)

inproceedings - Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation
International Conference on Control, Automation, Robotics & Embedded Systems, CARE'13. / Jabalpur, India, India (2013, Pages pages 6)
Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
pdf | doi | bibtex@inproceedings{c7893ed6-49d8-4b0c-88d2-8151dcd472de, title = {Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation}, author = {Marturi, Naresh and Dembele, Sounkalo and Piat, Nadine}, year = {2013}, address = {Jabalpur, India, India}, booktitle = {International Conference on Control, Automation, Robotics \& Embedded Systems, CARE'13.}, month = {dec}, pages = {6}, url = {https://publiweb.femto-st.fr/tntnet/entries/5699/documents/author/data}, doi = {10.1109/CARE.2013.6733694}, organization = {IEEE} }
inproceedings - Visual Servoing-Based approach for efficient autofocusing in Scanning Electron Microscope
IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS'13. / Tokyo, Japan (2013, Pages pages 2677 - 2682)
Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
pdf | doi | bibtex@inproceedings{59e001a3-bf20-4760-8fa8-c184a89f7a25, title = {Visual Servoing-Based approach for efficient autofocusing in Scanning Electron Microscope}, author = {Marturi, Naresh and Tamadazte, Brahim and Dembele, Sounkalo and Piat, Nadine}, year = {2013}, address = {Tokyo, Japan}, booktitle = {IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS'13.}, month = {nov}, pages = {2677 - 2682}, url = {https://publiweb.femto-st.fr/tntnet/entries/5698/documents/author/data}, doi = {10.1109/IROS.2013.6696734}, organization = {IEEE} }
inproceedings - Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration
IEEE International Conference on Automation Science and Engineering, CASE'13. / Madison, WI, United States (2013, Pages pages 807 - 812)
Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
pdf | doi | bibtex@inproceedings{abb16966-7850-4c11-86ed-3f995af1d115, title = {Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration}, author = {Marturi, Naresh and Dembele, Sounkalo and Piat, Nadine}, year = {2013}, address = {Madison, WI, United States}, booktitle = {IEEE International Conference on Automation Science and Engineering, CASE'13.}, month = {aug}, pages = {807 - 812}, url = {https://publiweb.femto-st.fr/tntnet/entries/5697/documents/author/data}, doi = {10.1109/coASE.2013.6653936}, organization = {IEEE} }

2012 (3)

article - Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification.
International Journal of Optomechatronics (Volume 6, Mar 2012, Pages :1-16)
Malti, Abed Chaib | Dembele, Sounkalo | Piat, Nadine | Arnoult, Claire | Marturi, Naresh
pdf
inproceedings - Gluing free assembly of an advanced 3D structure using visual servoing.
Micromechanics and Microsystems Europe Workshop. / Ilmenau, Allemagne (Volume sur CD ROM, 2012, Pages pages 6 pages.)
Dembele, Sounkalo | Piat, Nadine | Marturi, Naresh | Tamadazte, Brahim
pdf | bibtex@inproceedings{dembele:hal-00799070, title = {Gluing free assembly of an advanced 3D structure using visual servoing.}, author = {Demb\'el\'e, Sounkalo and Piat, Nadine and Marturi, Naresh and Tamadazte, Brahim}, year = {2012}, address = {Ilmenau, Allemagne}, booktitle = {Micromechanics and Microsystems Europe Workshop.}, pages = {6 pages.}, url = {https://publiweb.femto-st.fr/tntnet/entries/1507/documents/author/data}, volume = {sur CD ROM} }
inproceedings - Performance Evaluation of Scanning Electron Microscopes using Signal-to-Noise Ratio.
Workshop on MicroFactories. / Tampere, Finlande (Volume sur CD ROM, 2012, Pages pages 1-6)
Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
pdf | bibtex@inproceedings{marturi:hal-00719444, title = {Performance Evaluation of Scanning Electron Microscopes using Signal-to-Noise Ratio.}, author = {Marturi, Naresh and Demb\'el\'e, Sounkalo and Piat, Nadine}, year = {2012}, address = {Tampere, Finlande}, booktitle = {Workshop on MicroFactories.}, pages = {1-6}, url = {https://publiweb.femto-st.fr/tntnet/entries/1525/documents/author/data}, volume = {sur CD ROM} }