Publications

2016 (3)

  • article - Combining Gradient Ascent Search and Support Vector Machines for Effective Autofocus of a Field Emission – Scanning Electron Microscope.
    Journal of Microscopy (Volume 264, Issue (1), oct 2016, Pages :79 - 87)
    Dembele, Sounkalo | Lehmann, Olivier | Medjaher, Kamal | Marturi, Naresh | Piat, Nadine
    pdf | doi | bibtex
  • article - Image-Guided Nanopositioning Scheme for SEM.
    IEEE Transactions on Automation Science and Engineering (Volume 99, jun 2016, Pages :1-12)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex
  • article - Visual Servoing-Based Depth Estimation Technique for Manipulation inside SEM
    IEEE Transactions on Instrumentation and Measurement (Volume 65, Issue (8), 2016, Pages :1847 - 1855)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex

2015 (1)

  • inproceedings - Closed-Loop Autofocus Scheme for Scanning Electron Microscope.
    International Symposium of Optomechatronics Technology, ISOT'15. / Neuchâtel, Switzerland (2015, Pages pages 1-6)
    Cui, Le | Marturi, Naresh | Marchand, Eric | Dembele, Sounkalo | Piat, Nadine
    doi | bibtex

2014 (2)

  • inproceedings - Visual Servoing Schemes for Automatic Nanopositioning Under Scanning Electron Microscope.
    IEEE International Conference on Robotics and Automation, ICRA'14. / Hong Kong, China (2014, Pages pages 981-986)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex
  • article - Scanning electron microscope image signal-to-noise ratio monitoring for micro-nanomanipulation
    Scanning (Volume 36, feb 2014, Pages :419 - 429)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex

2013 (3)

  • inproceedings - Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation
    International Conference on Control, Automation, Robotics & Embedded Systems, CARE'13. / Jabalpur, India, India (2013, Pages pages (6 pages))
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex
  • inproceedings - Visual Servoing-Based approach for efficient autofocusing in Scanning Electron Microscope
    IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS'13. / Tokyo, Japan (2013, Pages pages 2677 - 2682)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex
  • inproceedings - Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration
    IEEE International Conference on Automation Science and Engineering, CASE'13. / Madison, WI, United States (2013, Pages pages 807 - 812)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex

2012 (3)

  • article - Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification.
    International Journal of Optomechatronics (Volume 6, Mar 2012, Pages :1-16)
    Malti, Abed Chaib | Dembele, Sounkalo | Piat, Nadine | Arnoult, Claire | Marturi, Naresh
    pdf | bibtex
  • inproceedings - Gluing free assembly of an advanced 3D structure using visual servoing.
    Micromechanics and Microsystems Europe Workshop. / Ilmenau, Allemagne (Volume sur CD ROM, 2012, Pages pages 6 pages.)
    Dembele, Sounkalo | Piat, Nadine | Marturi, Naresh | Tamadazte, Brahim
    pdf | bibtex
  • inproceedings - Performance Evaluation of Scanning Electron Microscopes using Signal-to-Noise Ratio.
    Workshop on MicroFactories. / Tampere, Finlande (Volume sur CD ROM, 2012, Pages pages 1-6)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    pdf | bibtex