Publications

Category article

2016

  • Visual Servoing-Based Depth Estimation Technique for Manipulation inside SEM
    IEEE Transactions on Instrumentation and Measurement (Volume 65, Issue (8), 2016, Pages :1847 - 1855)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex
  • Combining Gradient Ascent Search and Support Vector Machines for Effective Autofocus of a Field Emission – Scanning Electron Microscope.
    Journal of Microscopy (Volume 264, Issue (1), oct 2016, Pages :79 - 87)
    Dembele, Sounkalo | Lehmann, Olivier | Medjaher, Kamal | Marturi, Naresh | Piat, Nadine
    pdf | doi | bibtex
  • Image-Guided Nanopositioning Scheme for SEM.
    IEEE Transactions on Automation Science and Engineering (Volume 99, jun 2016, Pages :1-12)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex

2014

  • Scanning electron microscope image signal-to-noise ratio monitoring for micro-nanomanipulation.
    The Journal of Scanning Microscopies. (feb 2014, Pages pp 1-11)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex

2012

  • Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification.
    International Journal of Optomechatronics (Volume 6, Mar 2012, Pages :1-16)
    Malti, Abed Chaib | Dembele, Sounkalo | Piat, Nadine | Arnoult, Claire | Marturi, Naresh
    pdf | bibtex

Category inproceedings

2015

  • Closed-Loop Autofocus Scheme for Scanning Electron Microscope.
    International Symposium of Optomechatronics Technology, ISOT'15. / Neuchâtel, Switzerland (2015, Pages pages 1-6)
    Cui, Le | Marturi, Naresh | Marchand, Eric | Dembele, Sounkalo | Piat, Nadine
    doi | bibtex

2014

  • Visual Servoing Schemes for Automatic Nanopositioning Under Scanning Electron Microscope.
    IEEE International Conference on Robotics and Automation, ICRA'14. / Hong Kong (2014, Pages pages 981-986)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex

2013

  • Fast Image Drift Compensation in Scanning Electron Microscope using Image Registration.
    IEEE International Conference on Automation Science and Engineering, CASE'13. (2013, Pages pages 807-812)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    doi | bibtex
  • Visual Servoing-Based approach for efficient autofocusing in Scanning Electron Microscope.
    IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS'13. (2013, Pages pages 2677-2682)
    Marturi, Naresh | Tamadazte, Brahim | Dembele, Sounkalo | Piat, Nadine
    pdf | doi | bibtex
  • Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation.
    International Conference on Control, Automation, Robotics & Embedded Systems, CARE'13. (2013, Pages pages 1-6)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    bibtex

2012

  • Gluing free assembly of an advanced 3D structure using visual servoing.
    Micromechanics and Microsystems Europe Workshop. / Ilmenau, Allemagne (Volume sur CD ROM, 2012, Pages pages 6 pages.)
    Dembele, Sounkalo | Piat, Nadine | Marturi, Naresh | Tamadazte, Brahim
    pdf | bibtex
  • Performance Evaluation of Scanning Electron Microscopes using Signal-to-Noise Ratio.
    Workshop on MicroFactories. / Tampere, Finlande (Volume sur CD ROM, 2012, Pages pages 1-6)
    Marturi, Naresh | Dembele, Sounkalo | Piat, Nadine
    pdf | bibtex